SCANNING ELECTRON MICROSCOPY OF RESONATING QUARTZ CRYSTALS
- 15 January 1971
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 18 (2), 39-41
- https://doi.org/10.1063/1.1653552
Abstract
SL‐ and AT‐cut quartz crystal resonators which are commonly used in frequency control devices were examined in the scanning electron microscope. The quartz slices were resonated at frequencies ranging from 455 kHz to 15 MHz. Variations in surface charges which were produced during resonance strongly affected secondary electron emission. Therefore, micrographs could be obtained which were characteristic of the various modes of motion of the resonators. From displacements of topographical features during resonance approximate values for the amplitudes of face and thickness shear were obtained.Keywords
This publication has 4 references indexed in Scilit:
- Time-Resolved Scanning Electron Microscopy and Its Application to Bulk-Effect OscillatorsJournal of Applied Physics, 1969
- X-ray topographic description of mode in a vibrating crystalJournal of Applied Crystallography, 1969
- Messung von Plattenschwingungen sehr kleiner Amplitude durch LichtstrommodulationThe European Physical Journal A, 1964
- Factors Affecting Contrast and Resolution in the Scanning Electron Microscope†Journal of Electronics and Control, 1959