On-wafer characterization of monolithic millimeter-wave integrated circuits by a picosecond optical electronic technique
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 237-240 vol.1
- https://doi.org/10.1109/mwsym.1988.22021
Abstract
A picosecond optical electronic sampling technique for the characterization of monolithic microwave integrated circuits (MMICs) has been developed. The measured time-domain response allows the spectral transfer function of the MMIC to be obtained. This technique was applied to characterize the frequency response of a two-stage Ka-band MMIC amplifier. The broadband results agree well with those obtained by conventional network analyzer measurements.<>Keywords
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