A Four Parameter E vs dE/dx and Tie-of-Flight Computerized Charged Particle Experiment
- 1 February 1968
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 15 (1), 145-149
- https://doi.org/10.1109/tns.1968.4324845
Abstract
For detection of charged particles from 1 to 60 MeV, three solid state detectors are utilized in a dE/dx telescope configuration. Signals are summed digitally and displayed on a 2-dimensional "flicker box" and transmitted off-line to a larger computer for "tail corrections", dead layer corrections, and final analysis. Time-of-flight is utilized for nonpenetrating particles. p, D, T, 3He, α etc. can be distinguished from 1 to 60 MeV with ~180 keV system energy resolution.Keywords
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