Recoverable degradation phenomena of quantum efficiency in organic EL devices
- 1 June 2000
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 111-112, 245-247
- https://doi.org/10.1016/s0379-6779(99)00373-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Spontaneous and reverse-bias induced recovery behavior in organic electroluminescent diodesApplied Physics Letters, 1998
- Study on the degradation mechanism of organic light-emitting diodes (OLEDs)Synthetic Metals, 1997
- Progress in Electroluminescent Devices Using Molecular Thin FilmsMRS Bulletin, 1997
- Effect of Impurity Ions and Permanent Dipoles for Device Performance of Thin-Film Electroluminescent DiodesMRS Proceedings, 1997