Relaxation of-() Using Surface X-Ray Diffraction
- 20 January 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 78 (3), 495-498
- https://doi.org/10.1103/physrevlett.78.495
Abstract
Surface x-ray diffraction has been used to determine the structural relaxations of . The magnitudes range from 0 to 0.27 Å, leading to rumpling of the titanium planes. The data are compared to the results of three independent calculations of the energy minimized structure. Excellent agreement is achieved with the positions of titanium atoms predicted by Ramamoorthy et al. [Phys. Rev. B 49, 16 721 (1994)].
Keywords
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