On the detection and size classification of nanometer-size metal particles on amorphous substrates
- 31 December 1986
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 20 (1-2), 1-14
- https://doi.org/10.1016/0304-3991(86)90161-0
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- An ultrahigh vacuum multipurpose specimen chamber with sample introduction system for i n s i t u transmission electron microscopy investigationsJournal of Vacuum Science & Technology A, 1986
- A TEM study of the electron-beam interaction with small supported palladium particles and alumina and titania substratesUltramicroscopy, 1985
- Preparation and analysis of particulate metal depositsThin Solid Films, 1985
- Structure and morphology characterization of nanometer-size metal aggregates by electron scattering patternsLangmuir, 1985
- Phenomenological in-situ TEM gas exposure studies of palladium particles on MgO at room temperatureUltramicroscopy, 1984
- In situ transmission electron microscope studies of palladium on MgOJournal of Catalysis, 1983
- The structure of small, vapor-deposited particlesJournal of Crystal Growth, 1979
- Selected-Zone Dark-Field Electron MicroscopyApplied Physics Letters, 1972
- Images of Thorium Atoms in Transmission Electron MicroscopyJapanese Journal of Applied Physics, 1971
- HIGH-RESOLUTION ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE PLANES USING CONICAL ILLUMINATIONApplied Physics Letters, 1970