A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron Microscopy
- 1 March 1969
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 8 (3), 405
- https://doi.org/10.1143/jjap.8.405
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Stress Measurable Tensile Device for Electron Microscopic ObservationJournal of the Physics Society Japan, 1968
- Continuous Observation of Cell Formation in Aluminum with a 500kV Electron MicroscopeJournal of the Physics Society Japan, 1966