A study on the X-ray line profile
- 31 May 1964
- Vol. 30 (5), 1044-1050
- https://doi.org/10.1016/0031-8914(64)90236-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A method of distinguishing between Gauss and Cauchy diffraction profilesActa Crystallographica, 1963
- The Synthesis of X-Ray Spectrometer Line Profiles with Application to Crystallite Size MeasurementsJournal of Applied Physics, 1954
- X-Ray Diffraction MethodsJournal of Applied Physics, 1941