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Enhanced Nano-Oxidation on a SC1-Treated Si Surface Using Atomic Force Microscopy
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Enhanced Nano-Oxidation on a SC1-Treated Si Surface Using Atomic Force Microscopy
Enhanced Nano-Oxidation on a SC1-Treated Si Surface Using Atomic Force Microscopy
WM
Won-Chul Moon
Won-Chul Moon
Tatsuo Yoshinobu
Tatsuo Yoshinobu
HI
Hiroshi Iwasaki
Hiroshi Iwasaki
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15 July 2002
journal article
Published by
IOP Publishing
in
Japanese Journal of Applied Physics
Vol. 41
(Part 1, No)
,
4754-4757
https://doi.org/10.1143/jjap.41.4754
Abstract
No abstract available
Keywords
HYDROPHILICITY
AFM
ATOMIC FORCE MICROSCOPY
NANOFABRICATION
SILICON
Cited by 11 articles