Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering
- 1 July 2001
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 179 (1-4), 8-12
- https://doi.org/10.1016/s0169-4332(01)00254-9
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Spontaneous Pattern Formation on Ion Bombarded Si(001)Physical Review Letters, 1999
- The complex formation of ripples during depth profiling of Si with low energy, grazing oxygen beamsApplied Physics Letters, 1998
- Analyzing atomic force microscopy images using spectral methodsJournal of Applied Physics, 1997
- Fractal Concepts in Surface GrowthPublished by Cambridge University Press (CUP) ,1995
- Effect of tip shape on surface roughness measurements from atomic force microscopy images of thin filmsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995
- Kinetics of Surface Growth: Phenomenology, Scaling, and Mechanisms of Smoothening and RougheningAnnual Review of Physical Chemistry, 1994
- Roughening instability and evolution of the Ge(001) surface during ion sputteringPhysical Review Letters, 1994
- Tip artifacts in atomic force microscope imaging of thin film surfacesJournal of Applied Physics, 1993
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982