Rapid repetitive scanning of impurity spectral line profiles in the VUV for Doppler temperature measurements in the TFR Tokamak
- 1 February 1980
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 13 (2), 216-221
- https://doi.org/10.1088/0022-3735/13/2/023
Abstract
The authors describe a monochromator capable of high resolution (resolving power above 50000) in the near vacuum ultraviolet spectral region. The instrument is equipped with a vibrating mirror before the exit slit, in order to scan the spectral line under study several times during one Tokamak discharge. Examples of ion temperature measurements in the plasma periphery by using impurity lines are given.Keywords
This publication has 9 references indexed in Scilit:
- Vacuum ultraviolet spectroscopic apparatus for space- and time-resolved measurements on a single Tokamak plasma dischargeJournal of Physics E: Scientific Instruments, 1979
- Doppler-Broadening Measurements of X-Ray Lines for Determination of the Ion Temperature in Tokamak PlasmasPhysical Review Letters, 1979
- Observation of a Forbidden Line of Fe xx and Its Application for Ion Temperature Measurements in the Princeton Large Torus TokamakPhysical Review Letters, 1978
- Tokamak plasma diagnosticsNuclear Fusion, 1978
- Space-resolved vacuum ultra-violet spectroscopy on T.F.R. Tokamak plasmasPlasma Physics, 1978
- Spectroscopic measurements of ion temperature in ATC tokamak with RF and neutral-beam heatingNuclear Fusion, 1977
- Plasma diagnostics using high-resolution spectroscopic techniques*†Journal of the Optical Society of America, 1977
- Diagnostic forbidden lines of highly ionized elements for tokamak plasmasJournal of Applied Physics, 1976
- Composition Product SimulatorApplied Optics, 1964