TEM methods for the characterization of fine metal multilayers
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 16 (2), 213-225
- https://doi.org/10.1016/0304-3991(85)90075-0
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- The measurement of boundary displacements in metalsUltramicroscopy, 1984
- Low temperature diffusion measurements on d.c. sputtered multilayers of Nb/TaJournal of Materials Science Letters, 1984
- Structural, elastic, and transport anomalies in molybdenum/nickel superlatticesPhysical Review B, 1983
- Recent improvements to the Cambridge University 600 kV High Resolution Electron MicroscopeJournal of Microscopy, 1983
- Elastic modulus in composition-modulated silver-palladium and copper-gold foilsJournal of Applied Physics, 1983
- Localization in a three-dimensional metalPhysical Review B, 1982
- Lattice fringe imaging of modulated structuresPhilosophical Magazine A, 1981
- Enhanced elastic modulus in composition-modulated gold-nickel and copper-palladium foilsJournal of Applied Physics, 1977
- The principles and practice of the weak‐beam method of electron microscopyJournal of Microscopy, 1973