Chemical beam epitaxially grown InP/InGaAsP interference mirror for use near 1.55 μm wavelength

Abstract
An interference mirror for use near 1.55 μm wavelength was constructed using InP and lattice-matched InGaAsP on an InP substrate with chemical beam epitaxy methods. The maximum reflectivity was 92.5% at 1.46 μm. The design value was 94.75% at 1.55 μm. The mirror was used as an output mirror in a synchronously pumped mode-locked Tl:KCl color center laser.