Identification of the 0.82-eV Electron Trap,in GaAs, as an Isolated Antisite Arsenic Defect
- 11 November 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 55 (20), 2204-2207
- https://doi.org/10.1103/physrevlett.55.2204
Abstract
is a technologically important deep level in GaAs whose identification has been the subject of intense study. In this paper we present uniaxial stress and magnetic field experiments which establish for the first time that has tetrahedral symmetry and is, therefore, an isolated point defect. Combining this result with earlier data, we conclude that is an isolated arsenic antisite defect.
Keywords
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