Characterization of Te precipitates in CdTe crystals
- 1 July 1983
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 43 (1), 68-70
- https://doi.org/10.1063/1.94123
Abstract
Te precipitates in CdTe have been characterized by Auger spectroscopy, x-ray diffraction, and Raman spectroscopy. The x-ray results show that the precipitated Te in Bridgman-grown CeTe crystals has the same structural phase as observed in elemental Te under high pressure. Auger and Raman microprobe spectroscopy were carried out to confirm Te precipitates in CdTe and identify the symmetry of the Te precipitates.Keywords
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