Growth kinetics of the θ phase in AlCu thin film bilayers
- 1 July 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 52 (1), 97-101
- https://doi.org/10.1016/0040-6090(78)90260-2
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Investigation of diffusion in the CuAl thin film systemThin Solid Films, 1977
- Kinetics of phase formation in Au—A1 thin filmsPhilosophical Magazine, 1975
- Electromigration of grain boundaries in aluminumThin Solid Films, 1975
- Kirkendall study of electromigration in thin filmsThin Solid Films, 1975
- Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92, E(4He) = 400–4000 keVAtomic Data and Nuclear Data Tables, 1974