100 GHz on-wafer S-parameter measurements by electrooptic sampling
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Reduction of timing fluctuations in a mode-locked Nd:YAG laser by electronic feedbackOptics Letters, 1986
- Electrooptic sampling in GaAs integrated circuitsIEEE Journal of Quantum Electronics, 1986
- Subpicosecond electrooptic sampling: Principles and applicationsIEEE Journal of Quantum Electronics, 1986