Scanning Electrochemical Microscopy of Electroactive Defect Sites in the Native Oxide Film on Aluminum
- 1 January 2001
- journal article
- Published by The Electrochemical Society in Electrochemical and Solid-State Letters
- Vol. 4 (1), B4-B6
- https://doi.org/10.1149/1.1344278
Abstract
Scanning electrochemical microscopy (SECM) of localized electron-transfer activity at Al surfaces covered by a 2-3 nm thick native oxide film is reported. electrodes prepared from Al rods (99.9965%) and foils (99.45% and 99.9995%) were imaged in acetonitrile solutions using the nitrobenzene (NB)/nitrobenzene radical anion redox couple as redox mediator. The SECM images reveal microscopic defect sites with radii between 1 and 10 μm that display high electron-transfer activity for NB reduction. The results indicate that the native oxide film on Al contains structural or electronic defects associated with high electronic conductivity. © 2000 The Electrochemical Society. All rights reserved.Keywords
This publication has 16 references indexed in Scilit:
- Chemically-Selective and Spatially-Localized Redox Activity at Ta/Ta2O5ElectrodesLangmuir, 1998
- Scanning Electrochemical Microscopy: Measurement of the Current Density at Microscopic Redox-Active Sites on TitaniumThe Journal of Physical Chemistry B, 1998
- Determination of Precursor Sites for Pitting Corrosion of Polycrystalline Titanium by Using Different TechniquesJournal of the Electrochemical Society, 1998
- Scanning electrochemical microscopy of native titanium oxide films. Mapping the potential dependence of spatially-localized electrochemical reactionsThe Journal of Physical Chemistry, 1995
- Pitting Corrosion of TitaniumJournal of the Electrochemical Society, 1994
- Scanning Electrochemical Microscopy of Precursor Sites for Pitting Corrosion on TitaniumJournal of the Electrochemical Society, 1993
- Scanning electrochemical microscopy. Introduction and principlesAnalytical Chemistry, 1989
- Spatiotemporal description of the diffusion layer with a microelectrode probeAnalytical Chemistry, 1987
- Measurements within the diffusion layer using a microelectrode probeAnalytical Chemistry, 1986
- Spatial resolution of electrode heterogeneity using iontophoresisAnalytical Chemistry, 1984