Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview
- 1 June 1990
- journal article
- Published by Elsevier in Industrial Metrology
- Vol. 1 (2), 79-99
- https://doi.org/10.1016/0921-5956(90)80019-r
Abstract
No abstract availableKeywords
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