XPS Study of Bi-Sr-Ca-Cu-O Superconducting Thin Films Prepared by the rf-Sputtering Method
- 1 February 1989
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 28 (2A), L233
- https://doi.org/10.1143/jjap.28.l233
Abstract
The charge fluctuation of Cu ions in the superconducting Bi-Sr-Ca-Cu-O system was investigated using X-ray photoemission spectroscopy in thin films prepared by the rf-sputtering method. It was confirmed that long-time annealing was essential to form the high-T c phase in thin films of this Bi-Sr-Ca-Cu-O system. From the peak decompositions of the Cu 2p3/2 core-level spectra obtained after Ar ion etching, the content ratio of the Cu2+ state to the Cu+ state was found to increase with an increase of the high-T c phase content in the films.Keywords
This publication has 6 references indexed in Scilit:
- Electronic structures of the surface and its modification by sputtering and adatoms of Ti and CuPhysical Review B, 1988
- Oxidation states of Cu, Ba and Y in superconducting YBa2Cu3O7?xZeitschrift für Physik B Condensed Matter, 1988
- X-ray photoelectron spectroscopy of the high-temperature superconductor YBa2Cu3O7?x and the copper oxidesZeitschrift für Physik B Condensed Matter, 1988
- A New High-Tc Oxide Superconductor without a Rare Earth ElementJapanese Journal of Applied Physics, 1988
- The Cu valence in the highT c superconductors and in monovalent, divalent and trivalent copper oxides determined from XPS core level spectroscopyZeitschrift für Physik B Condensed Matter, 1987
- Electronic Structures and Superconducting Mechanism of Ba2Y1Cu3O7Japanese Journal of Applied Physics, 1987