Trace element analysis using proton-induced X-ray emission spectroscopy
- 1 February 1974
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 114 (3), 573-579
- https://doi.org/10.1016/0029-554x(74)90182-7
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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