Improvement and application of the fourier-transformed pattern from a small area of high resolution electron microscope images
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 16 (1), 9-18
- https://doi.org/10.1016/s0304-3991(85)80003-6
Abstract
No abstract availableKeywords
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