Investigation of the local structure of As-related acceptor centres in InSe by means of fluorescence-detected XAS
- 12 August 2002
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 17 (9), 1023-1027
- https://doi.org/10.1088/0268-1242/17/9/321
Abstract
No abstract availableKeywords
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