Material Characterization of Thick Film Resistor Pastes
- 1 December 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 1 (4), 383-392
- https://doi.org/10.1109/tchmt.1978.1135303
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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