A new method of determining structure factors of x-rays using half-value widths of diffraction curves from perfect crystals
- 19 October 1970
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 33 (3), 151-152
- https://doi.org/10.1016/0375-9601(70)90702-4
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellösung FringesJournal of the Physics Society Japan, 1965
- Absolute X-Ray Scattering Factors of Silicon and GermaniumPhysical Review B, 1965
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- Intensity of X-ray reflexion from perfect and mosaic absorbing crystalsActa Crystallographica, 1950