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High Resolution Surface Analysis by TOF-SIMS
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High Resolution Surface Analysis by TOF-SIMS
High Resolution Surface Analysis by TOF-SIMS
BH
Birgit Hagenhoff
Birgit Hagenhoff
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1 April 2000
journal article
Published by
Springer Nature
in
Microchimica Acta
Vol. 132
(2-4)
,
259-271
https://doi.org/10.1007/s006040050019
Abstract
No abstract available
Keywords
TOF SIMS
LATERAL RESOLUTION
SECONDARY ION
SURFACE ANALYSIS
Cited by 105 articles