Methods for a precision measurement of ionic masses and appearance energies using the pulsed-laser time-of-flight atom probe
- 1 August 1984
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 55 (8), 1246-1254
- https://doi.org/10.1063/1.1137930
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Energy distributions of pulsed-laser field-desorbed gaseous ions and field-evaporated metal ions: A direct time-of-flight measurementPhysical Review B, 1984
- Field induced and surface catalyzed formation of novel ions : A pulsed-laser time-of-flight atom-probe studyThe Journal of Chemical Physics, 1983
- Photon-induced field ionization mass spectrometry of ethylene on silverSurface Science, 1979
- Field ion image formationSurface Science, 1978
- The critical energy deficit of field emitted ionsSurface Science, 1977
- The 1977 atomic mass evaluation: in four parts part I. Atomic mass tableAtomic Data and Nuclear Data Tables, 1977
- Surface characterization by single-atom mass spectroscopyC R C Critical Reviews in Solid State Sciences, 1975
- Premature field evaporation in the atom probeReview of Scientific Instruments, 1974
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972
- Calibration of the Atom Probe FIMReview of Scientific Instruments, 1969