Scatter Correction In Single-photon Imaging Using Multiple Energy Bins And Minimum-risk Estimators
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1159-1163
- https://doi.org/10.1109/nssmic.1993.701829
Abstract
First Page of the Article Author(s) Haynor, D.R. University of Washington Kaplan, M.S. ; O'Sullivan, F.S. ; Miyaoka, R.M. ; Pollard, K.R. ; Harrison, R.L. ; Lewellen, T.K.Keywords
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