New Evaluation Method of Evaporated Organic Thin Films by Energy Dispersive X-Ray Diffractometer

Abstract

A new method was developed to obtain clear diffraction patterns of organic thin films evaporated on substrates such as Au. In this method, total reflection on substrates was utilized to most efficiently collect the diffracted X-rays from organic thin films. The X-rays were detected with a pure Ge solid-state detector set at a constant scattering angle and analyzed with a multichannel analyzer. Excellent performance of this system was demonstrated for a thin stearic acid film evaporated on Au and Cu-phthalocyanine on glass.