Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
- 31 December 2011
- journal article
- review article
- Published by Elsevier in Progress in Surface Science
- Vol. 86 (11-12), 328-376
- https://doi.org/10.1016/j.progsurf.2011.08.004
Abstract
No abstract availableKeywords
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