New Phenomenon in the Absorption of Oxygen on Silicon

Abstract
An O2 adsorption state on the Si(111) 2×1 surface has been found which will remove surface states without producing a chemical shift of the Si 2p core level, suggesting a strongly covalent bond. This is accomplished by using an initial exposure pressure of 108 Torr. Exposures using an initial exposure pressure of 106 Torr also remove the surface states but produce a 2.0 eV Si 2p chemical shift indicating an ionic bond different from that of SiO2 (shift of 3.8 eV).