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Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing
Home
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Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing
Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing
J. W. Lyding
J. W. Lyding
KH
K. Hess
K. Hess
IK
I. C. Kizilyalli
I. C. Kizilyalli
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29 April 1996
journal article
Published by
AIP Publishing
in
Applied Physics Letters
Vol. 68
(18)
,
2526-2528
https://doi.org/10.1063/1.116172
Abstract
No abstract available
Keywords
MICROSTRUCTURES
ISOTOPE EFFECT
SEMICONDUCTOR DEVICES
Cited by 318 articles