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Quantitative analysis of scanning electron micrographs
Home
Publications
Quantitative analysis of scanning electron micrographs
Quantitative analysis of scanning electron micrographs
JH
J. E. Hilliard
J. E. Hilliard
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1 February 1972
journal article
Published by
Wiley
in
Journal of Microscopy
Vol. 95
(1)
,
45-58
https://doi.org/10.1111/j.1365-2818.1972.tb03710.x
Abstract
No abstract available
Keywords
IRREGULAR SURFACES
SCANNING ELECTRON MICROGRAPHS
QUANTITATIVE
SPECIMEN
MICROGRAPHS SCANNING
TWO PARTS
SPECIFIC FEATURES
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