Specimen thickness determination in transmission electron microscopy in the general case
- 31 December 1973
- journal article
- Published by Elsevier in Micron (1969)
- Vol. 4 (1), 111-116
- https://doi.org/10.1016/0047-7206(72)90010-6
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Precise orientation determination by electron diffraction single-pole Kikuchi patternsPhysica Status Solidi (a), 1971