The measurement of position dependent trace element concentrations with micro-proton induced X-ray emission
- 1 January 1983
- journal article
- research article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 38 (9), 1209-1215
- https://doi.org/10.1016/0584-8547(83)80064-0
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A proton microbeam under constructionNuclear Instruments and Methods, 1981
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- A new peak search method for an automatic spectrum analysis programNuclear Instruments and Methods, 1975
- The capabilities of proton induced X-ray fluorescence in analytical chemistryJournal of Radioanalytical and Nuclear Chemistry, 1975