Near-infrared contact mode collection near-field optical and normal force microscopy of modulated multiple quantum well lasers

Abstract

Contact near-field and far-field imaging of multiple quantum well (MQW) structures emitting at 1.54 μm is reported using bent normal force/near-field optical elements for simultaneous imaging of the light distribution, topography, and modulation of the normal force signal with laser modulation. Excellent registration and correlation of each of these images is reported. Alterations in the distribution of the light emission in going from the near to the far-field is detected in agreement with theoretical deductions. Nonetheless, differences are also noted in this light distribution from standard understandings.