X-ray microanalysis of thin foil Al-Ag alloys
- 1 October 1977
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 10 (14), 1883-1889
- https://doi.org/10.1088/0022-3727/10/14/004
Abstract
Measurements have been made of the intensity of Al and Ag X-rays generated from thin foils of Al alloys containing up to 22 wt.% Ag, using both wavelength and energy dispersive spectrometers and for electrons of energy between 45 and 100 keV. The intensity ratio I(Ag)/I(Al) would be expected to be constant with thickness but was found to increase up to six-fold for very thin foils. This anomaly prevents quantitative high resolution electron probe microanalysis using thin foils of this alloy.Keywords
This publication has 6 references indexed in Scilit:
- The quantitative analysis of thin specimensJournal of Microscopy, 1975
- The use of the analytical electron microscope EMMA-4 to study the solute distribution in thin foils: some applications to metals and mineralsJournal of Microscopy, 1973
- Darstellung, Schwingungsspektren und Normalkoordinatenanalyse der Ionen GeS4 4- und SnS4 4- / Preparation, Vibrational Spectra and Normal Coordinate Analysis of the Ions GeS4 4- and SnS4 4-Zeitschrift für Naturforschung B, 1973
- On the production of characteristic X-rays in thin metal crystalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1966
- Multiple scattering of 5-30 keV electrons in evaporated metal films II: Range-energy relationsBritish Journal of Applied Physics, 1964
- Enhanced X-ray emission from extinction contours in a single-crystal gold filmPhilosophical Magazine, 1962