Electrical Resistivity of Silver Films
- 15 February 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 166 (3), 652-655
- https://doi.org/10.1103/physrev.166.652
Abstract
The resistivities of epitaxially grown silver films have been measured as a function of temperature from 4.2 to 295°K. Both the temperature-independent residual resistivity and the temperature-dependent resistivity were found to increase with a decrease in the specimen thickness. The increase in the temperature-dependent part of the resistivity occurs in the temperature interval of 10 to 40°K. It may be interpreted as being due to low-angle electron-phonon scattering, which causes a greater increment of resistivity in a film than in a bulk specimen.This publication has 17 references indexed in Scilit:
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