An Improved Phase Shift Technique for Measuring Short Carrier Lifetime in Semiconductors

Publisher Website

1 July 1971

journal article
research article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 42 (7), 1084-1086
https://doi.org/10.1063/1.1685296

Abstract

No abstract available

Keywords

PHASE SHIFT

This publication has 2 references indexed in Scilit:

Lifetimes of Bound Excitons in CdS
Physical Review B, 1970
INTERFEROMETRIC PHASE SHIFT TECHNIQUE FOR MEASURING SHORT FLUORESCENT LIFETIMES
Applied Physics Letters, 1964

Cited by 6 articles