Layer Correlation in a-As2(SexS1-x)3 Systems
- 1 December 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (12R), 1784-1789
- https://doi.org/10.1143/jjap.22.1784
Abstract
The structure factors of a-As2(Se x S1-x )3 (0≤x≤1.0) were measured by neutron diffraction, and the behaviors of the first sharp diffraction peaks with change in x were found to differ greatly from those of the other peaks. The positions of the first peaks did not shift with x. From these behaviors, we were able to confirm the presence of layer correlations in As-chalcogenide glasses. The bond lengths of As–S and As–Se do not change with alloying, and the bonding pairs of As and chalcogen atoms are combined randomly.Keywords
This publication has 13 references indexed in Scilit:
- Low-frequency inelastic light scattering from As-S glassesSolid State Communications, 1982
- Temperature Dependence of the Structure Factor ofGlass Up to the Glass TransitionPhysical Review Letters, 1981
- Photoelastic trends for amorphous and crystalline solids of differing network dimensionalityPhysical Review B, 1981
- Network dynamics of 3:2 coordinated compoundsPhysical Review B, 1978
- The structure of liquid As2Se3 and GeSe2 by neutron diffractionJournal of Non-Crystalline Solids, 1978
- A comparison of the structures of vapour-deposited and bulk arsenic sulphide glassesJournal of Non-Crystalline Solids, 1977
- Electron diffraction RDF analysis of amorphous As2Se3,AAs2Se2Te, As2SeTe2 and As2Te3 filmsJournal of Non-Crystalline Solids, 1974
- Diffraction studies of glass structureJournal of Non-Crystalline Solids, 1974
- Static approximation distortions and neutron time-of-flight diffraction using the Harwell LinacNuclear Instruments and Methods, 1974
- Crystalline structures of As2Se3 and As4Se4Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1973