Low Temperature Electrical Resistivity Measurements on Reactive Samples

Abstract

An apparatus and a technique for measuring electrical resistivities on reactive samples are described. Measurements were made in an inert atmosphere vacuum glove box containing a high purity helium environment. A precision micromanipulator was used to position a four point probe while observation was made through a microscope to guide the positioning of the probe. A cold stage permitted measurements to be made from room to liquid nitrogen temperature. This method was used to measure the electrical resistivities of cerium hydride single crystals.