Detection of probe dither motion in near-field scanning optical microscopy
- 1 November 1995
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 34 (31), 7273-7279
- https://doi.org/10.1364/ao.34.007273
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 9 references indexed in Scilit:
- Minimum detectable displacement in near-field scanning optical microscopyApplied Physics Letters, 1994
- Design and implementation of a low temperature near-field scanning optical microscopeReview of Scientific Instruments, 1994
- Correlative imaging in scanning near-field optical microscopyJournal of Vacuum Science & Technology A, 1993
- A micropipette force probe suitable for near-field scanning optical microscopyReview of Scientific Instruments, 1992
- Near-field differential scanning optical microscope with atomic force regulationApplied Physics Letters, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Near-field diffraction by a slit: implications for superresolution microscopyApplied Optics, 1986