Kelvin Device to Scan Large Areas for Variations in Contact Potential
- 1 September 1962
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 33 (9), 948-950
- https://doi.org/10.1063/1.1718036
Abstract
Many devices depend for their operation upon the establishment of known, uniform electric fields. Unknown contact potentials between the parts of the device often impair its performance. An apparatus has been constructed to measure the magnitude as well as the variation of such contact potentials with an accuracy of ±1 mV under conditions typical of bakeable high vacuum systems.Keywords
This publication has 5 references indexed in Scilit:
- Rotating Electrometer for Comparative Work Function MeasurementsReview of Scientific Instruments, 1956
- A Direct Comparison of the Kelvin and Electron Beam Methods of Contact Potential MeasurementPhysical Review B, 1952
- Studies in contact potentials. II. Vibrating cells for the vibrating condenser methodDiscussions of the Faraday Society, 1950
- Temperature Dependence of the Work Function of Tungsten from Measurement of Contact Potentials by the Kelvin MethodPhysical Review B, 1940
- A NEW METHOD OF MEASURING CONTACT POTENTIAL DIFFERENCES IN METALSReview of Scientific Instruments, 1932