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Determination of Depth Profiles by Angular Dependent X-Ray Photoelectron Spectra
Home
Publications
Determination of Depth Profiles by Angular Dependent X-Ray Photoelectron Spectra
Determination of Depth Profiles by Angular Dependent X-Ray Photoelectron Spectra
HI
Hiroshi Iwasaki
Hiroshi Iwasaki
RN
Ryusuke Nishitani
Ryusuke Nishitani
SN
Shogo Nakamura
Shogo Nakamura
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1 September 1978
journal article
Published by
IOP Publishing
in
Japanese Journal of Applied Physics
Vol. 17
(9)
,
1519-1523
https://doi.org/10.1143/jjap.17.1519
Abstract
No abstract available
Keywords
ANGULAR DEPENDENT
DEPTH PROFILES
RAY PHOTOELECTRON SPECTRA
DEPENDENT X RAY
PROFILES BY ANGULAR
Cited by 26 articles