Fast photothermal measurement system for inspection of weak adhesion defects
- 18 September 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (12), 1188-1190
- https://doi.org/10.1063/1.101651
Abstract
A simple and fast photothermal measurement system for nondestructive evaluation of coatings is presented. The sample surface is scanned with a focused laser beam and the resulting temperature rise is monitored with a focused infrared detector. The laser light scattered from the sample surface is measured with a photodiode and so both the optical and the thermal image of the sample can be obtained simultaneously. The functionality of the measurement system is demonstrated with two plasma-spray-coated samples.Keywords
This publication has 2 references indexed in Scilit:
- Thermographic methods applied to industrial materialsCanadian Journal of Physics, 1986
- Pulsed photothermal evaluation of layered materialsJournal of Applied Physics, 1984