An unbiased detector of curvilinear structures
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. 20 (2), 113-125
- https://doi.org/10.1109/34.659930
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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