Effects of Annealing Temperature on Microstructure and Electrical and Optical Properties of Radio‐Frequency‐Sputtered Tin‐Doped Indium Oxide Films
- 1 April 1989
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 72 (4), 698-701
- https://doi.org/10.1111/j.1151-2916.1989.tb06201.x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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