Principles of a TEM specimen device to meet highest requirements: Specimen temperature 5–300 K, cryo transfer, condensation protection, specimen tilt, stage stability for highest resolution
- 31 December 1981
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 6 (2), 115-124
- https://doi.org/10.1016/0304-3991(81)90051-6
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Open system microthermometry ? a technique for the measurement of local specimen temperature in the electron microscopeJournal of Materials Science, 1979
- Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperatureUltramicroscopy, 1978
- Eine tiefkühlkette zum überführen von wasserhaltigen biologischen objekten ins elektronenmikroskopJournal of Ultrastructure Research, 1974
- A novel specimen stage permitting high-resolution electron microscopy at low temperaturesJournal of Physics E: Scientific Instruments, 1972