Reflection characteristics of textured polycrystalline silicon substrates for solar cells
- 31 October 1988
- journal article
- Published by Elsevier in Solar Cells
- Vol. 25 (1), 15-26
- https://doi.org/10.1016/0379-6787(88)90053-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristicsReview of Scientific Instruments, 1988
- Design of antireflection coatings for textured silicon solar cellsSolar Cells, 1983
- Optical diffraction technique for determination of crystal orientationsApplied Optics, 1981