Structure sensitive factors in molecular cluster formation by ion bombardment of single crystal surfaces
- 1 December 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 78 (2), 467-477
- https://doi.org/10.1016/0039-6028(78)90092-4
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
- Chemisorption of oxygen on Ni(100) by SIMS and XPSSurface Science, 1978
- Cationization of organic molecules in secondary ion mass spectrometryJournal of the American Chemical Society, 1977
- Oxygen adsorption on molybdenum studied by low-energy secondary-ion mass spectrometry and electron-induced desorptionPhysical Review B, 1977
- Study of the sputtering of adsorbates by low energy ions (O on Ni)Surface Science, 1977
- SIMS, EID and flash-filament investigation of O2, H2, (O2 + H2) and H2O interaction with vanadiumSurface Science, 1977
- On the use of the saha-eggert equation for quantitative sims analysis using argon primary ionsSurface Science, 1976
- Developments in secondary ion mass spectroscopy and applications to surface studiesSurface Science, 1975
- The use of secondary ion mass spectrometry in surface analysisSurface Science, 1975
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973
- Ion Microprobe Mass AnalyzerScience, 1972